FLAGCHIP Transistor Health Model

The interactive demonstrator included in the link below is a visual tool for exploring the FLAGCHIP Transistor Health Model. It gathers in a single, easy-to-navigate view all the elements the model works with: the signals measured during testing, the internal properties that change as the device ages, and the indicators used to assess its condition. Each element is clickable — selecting one highlights what it means and shows exactly where it sits on the transistor, both on its circuit symbol and within its physical structure. Together, these views offer a clear and intuitive overview of how the measured signals, internal transistor parameters and health indicators are used for transistor health monitoring.